TDCF Test System

T3000 PLUS Time Delayed Collection Field Test System is literally the setup used for TDCF experiment. In order to measure the transient current of sample at the time scale of nanoseconds, high-performance pulse laser and high-speed pulse generator are configured. The system allows users to exhibit dynamic characteristics of optoelectronic device and extracts the parameters of the charge carrier creation, extraction and recombination via bias control experiments, different nano scale delays and various pulse wavelength.