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TOF Measurement System

TOF Measurement System
Introduction
Specification
Accessory
Documents

The time of flight measurement is essential for characterization of charge carrier mobility of organic semiconductor material, and T3000 TOF Measurement System performs standard TOF experiment based on Pulse laser and high-speed measurement electronics. Low temperature cryogenic is optional for the study of temperature dependence of carrier mobility.
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Add: No.1 Kechuang Road（Jingang Kechuangyuan), Qixia District,Nanjing.China

Tel：+86-025-84615783          E-mail：sales@bsyh-tech.com.cn
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