M6000 PIXX Imaging Lifetime Test System periodically measures the electroluminescence image while driving display devicessuch as OLED , QLED , Micro and Mini LED , and evaluates the variation of luminance , structural deformation and uniformity throughthe device life cycle , in addition to the conventional display device lifetime tests including voltage and current measurement.
Special features are：
-Scalable multi-channel system for the long-term imaging lifetime measurements of display devicesbit
-Compact 12-bit high-resolution imaging unit built in each test channel with V ( λ) Filter and fast auto-focusing module
-Various luminescence uniformity analysis including standard 9-section non-uniformity and structural similarity ( SSIM )
